发明申请
- 专利标题: Apparatus and method for detecting data error
- 专利标题(中): 用于检测数据错误的装置和方法
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申请号: US11492078申请日: 2006-07-25
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公开(公告)号: US20070033514A1公开(公告)日: 2007-02-08
- 发明人: Makoto Ogawa
- 申请人: Makoto Ogawa
- 专利权人: NEC ELECTRONICS CORPORATION
- 当前专利权人: NEC ELECTRONICS CORPORATION
- 优先权: JP2005-214035 20050725
- 主分类号: G06F11/00
- IPC分类号: G06F11/00 ; H03M13/00
摘要:
A semiconductor circuit includes a parity bit adding circuit configured to add a parity bit to a data to be read by a CPU; a register configured to hold the data with the parity bit; and a parity check circuit configured to execute a parity check of said data with said parity bit held in said register, and to issue a parity error interrupt when a parity error is detected. A parity bit inverting circuit inverts said parity bit held in said register in response to completion of said parity check.
公开/授权文献
- US07774690B2 Apparatus and method for detecting data error 公开/授权日:2010-08-10
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