发明申请
- 专利标题： Input capacitance characterization method in IP library
- 专利标题（中）： IP库中的输入电容表征方法
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申请号： US11197820申请日： 2005-08-05
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公开(公告)号： US20070033547A1公开(公告)日： 2007-02-08
- 发明人: Peter Chen , Han-Chi Liu , Chih-Yang Peng , Jyh-Herng Wang , Chia-Nan Hong
- 申请人： Peter Chen , Han-Chi Liu , Chih-Yang Peng , Jyh-Herng Wang , Chia-Nan Hong
- 主分类号： G06F17/50
- IPC分类号： G06F17/50
摘要：
A methodology for characterization of an IP (Intellectual Property) component is provided. Digital pins are recognized by skipping analog pins and special IO pins. First two layers of the IP component are classified in response to connection of the input pins. Partial circuits of the IP component are extracted for simulation. Three corners of IP library are generated. Therefore, input capacitance of the IP component is simulated.
公开/授权文献
- US07516427B2 Input capacitance characterization method in IP library 公开/授权日：2009-04-07
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