发明申请
- 专利标题: Source/drain electrodes, thin-film transistor substrates, manufacture methods thereof, and display devices
- 专利标题(中): 源极/漏极,薄膜晶体管基板,其制造方法和显示装置
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申请号: US11461907申请日: 2006-08-02
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公开(公告)号: US20070040172A1公开(公告)日: 2007-02-22
- 发明人: Nobuyuki Kawakami , Toshihiro Kugimiya , Hiroshi Gotoh , Katsufumi Tomihisa , Aya Hino
- 申请人: Nobuyuki Kawakami , Toshihiro Kugimiya , Hiroshi Gotoh , Katsufumi Tomihisa , Aya Hino
- 申请人地址: JP Kobe-shi
- 专利权人: Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- 当前专利权人: Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- 当前专利权人地址: JP Kobe-shi
- 优先权: JP2005-236994 20050817
- 主分类号: H01L29/04
- IPC分类号: H01L29/04
摘要:
A source/drain electrode is used in a thin-film transistor substrate containing a substrate, a thin-film transistor semiconductor layer, source/drain electrodes, and a transparent picture electrode. The source/drain electrode includes a nitrogen-containing layer and a thin film of pure aluminum or an aluminum alloy. Nitrogen of the nitrogen-containing layer binds to silicon of the thin-film transistor semiconductor layer, and the thin film of pure aluminum or aluminum alloy is connected to the thin-film transistor semiconductor layer through the nitrogen-containing layer.
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