发明申请
US20070045553A1 Light or radiation detecting unit manufacturing method, and a light or radiation detecting unit manufactured by this method
失效
光或辐射检测单元制造方法，以及通过该方法制造的光或辐射检测单元
- 专利标题： Light or radiation detecting unit manufacturing method, and a light or radiation detecting unit manufactured by this method
- 专利标题（中）： 光或辐射检测单元制造方法，以及通过该方法制造的光或辐射检测单元
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申请号： US11511344申请日： 2006-08-29
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公开(公告)号： US20070045553A1公开(公告)日： 2007-03-01
- 发明人: Susumu Adachi
- 申请人： Susumu Adachi
- 专利权人： SHIMADZU CORPORATION
- 当前专利权人： SHIMADZU CORPORATION
- 优先权： JPJP2005-250896 20050831
- 主分类号： G01T1/24
- IPC分类号： G01T1/24
摘要：
At least part of a readout pattern including carrier collecting electrodes, capacitors, thin-film transistors, data lines and gate lines is formed by vapor deposition or printing. This is formed separately from a semiconductor thick film. The semiconductor thick film and readout pattern constitute a flat panel X-ray detector (FPD) is mounted in a case to form a unit. A weight reduction is achieved by using the semiconductor thick film in place of a conventional glass substrate. The FPD manufactured in this way is free from great restrictions in time of transport and use.