发明申请
- 专利标题： Test modes for a semiconductor integrated circuit device
- 专利标题（中）： 半导体集成电路器件的测试模式
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申请号： US11211743申请日： 2005-08-26
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公开(公告)号： US20070046308A1公开(公告)日： 2007-03-01
- 发明人: Ronald Baker , George Alexander
- 申请人： Ronald Baker , George Alexander
- 主分类号： G01R31/02
- IPC分类号： G01R31/02
摘要：
A semiconductor integrated circuit device is provided including a switch to selectively supply a test signal to a pin on the integrated circuit device in response to a switch control signal. A control circuit is also provided to generate the switch control signal.
信息查询
