发明申请
- 专利标题： Magnetic field detection apparatus and method of adjusting the same
- 专利标题（中）： 磁场检测装置及其调整方法
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申请号： US11509609申请日： 2006-08-25
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公开(公告)号： US20070047152A1公开(公告)日： 2007-03-01
- 发明人: Taisuke Furukawa , Hiroshi Kobayashi , Takashi Takenaga , Takeharu Kuroiwa , Sadeh Beysen , Masakazu Taki
- 申请人： Taisuke Furukawa , Hiroshi Kobayashi , Takashi Takenaga , Takeharu Kuroiwa , Sadeh Beysen , Masakazu Taki
- 申请人地址： JP Chiyoda-ku
- 专利权人： MITSUBISHI ELECTRIC CORPORATION
- 当前专利权人： MITSUBISHI ELECTRIC CORPORATION
- 当前专利权人地址： JP Chiyoda-ku
- 优先权： JP2005-251787(P) 20050831
- 主分类号： G11B5/33
- IPC分类号： G11B5/33
摘要：
A magnetic field detection apparatus capable of changing the detection range and detection sensitivity as desired for a specific application is disclosed. A magnetoresistance effect element is applied a bias magnetic field and an external magnetic field. The bias magnetic field and the external magnetic field are generated on the same straight line, and therefore the bias magnetic field functions to hamper the external magnetic field applied to the magnetoresistance effect element. Thus, the magnetization of the free layer of the magnetoresistance effect element is suppressed, and the rotational angle of the magnetized vector is reduced. As a result, the characteristic of the resistance value of the magnetoresistance effect element to the external magnetic field is shifted by an amount equivalent to the bias magnetic field.