Invention Application
- Patent Title: Method and apparatus for asperity detection
- Patent Title (中): 粗糙度检测方法和装置
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Application No.: US11384956Application Date: 2006-03-20
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Publication No.: US20070047779A1Publication Date: 2007-03-01
- Inventor: Cathryn Goodman , Behnam Bavarian , Mark Lill
- Applicant: Cathryn Goodman , Behnam Bavarian , Mark Lill
- Main IPC: G06K9/00
- IPC: G06K9/00
Abstract:
An asperity detection apparatus and method wherein asperities are detected over a period of time. The resultant information can be used to characterize the asperities as three dimensional structures and/or with respect to their elastic and/or resilient behaviors or properties over time.
Information query
