Invention Application
- Patent Title: Apparatus And Method Of Testing Singulated Dies
- Patent Title (中): 测试单位模具的装置和方法
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Application No.: US11532494Application Date: 2006-09-15
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Publication No.: US20070063721A1Publication Date: 2007-03-22
- Inventor: Thomas Dozier , Benjamin Eldridge , David Hsu , Igor Khandros , Charles Miller
- Applicant: Thomas Dozier , Benjamin Eldridge , David Hsu , Igor Khandros , Charles Miller
- Assignee: FormFactor, Inc.
- Current Assignee: FormFactor, Inc.
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
An exemplary die carrier is disclosed. In some embodiments, the die carrier can hold a plurality of singulated dies while the dies are tested. The dies can be arranged on the carrier in a pattern that facilities testing the dies. The carrier can be configured to allow interchangeable interfaces to different testers to be attached to and detached from the carrier. The carrier can also be configured as a shipping container for the dies.
Public/Granted literature
- US07733106B2 Apparatus and method of testing singulated dies Public/Granted day:2010-06-08
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