发明申请
- 专利标题: Mass spectroscope and method of calibrating the same
- 专利标题(中): 质谱仪及其校准方法
-
申请号: US11508323申请日: 2006-08-23
-
公开(公告)号: US20070069123A1公开(公告)日: 2007-03-29
- 发明人: Shinji Nagai , Hiroyuki Yasuda , Tetsuya Nishida
- 申请人: Shinji Nagai , Hiroyuki Yasuda , Tetsuya Nishida
- 优先权: JP2003-426103 20031224
- 主分类号: H01J49/00
- IPC分类号: H01J49/00
摘要:
An ion resonance condition is corrected accurately in an ion trapping device. Measurements are repeated by alternately applying and not applying a resonance frequency voltage while spectral data is obtained continuously. Data obtained in the absence of the resonance frequency voltage is used as reference data to correct the set data of a resonance condition. As a result, calibration can be made while taking into consideration the variations in the amount of ions that are introduced into the ion trap.
公开/授权文献
- US07381948B2 Mass spectroscope and method of calibrating the same 公开/授权日:2008-06-03
信息查询