Invention Application
- Patent Title: Calibration mechanism of a scanning device
- Patent Title (中): 扫描装置的校准机制
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Application No.: US11518703Application Date: 2006-09-11
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Publication No.: US20070070457A1Publication Date: 2007-03-29
- Inventor: Sung-Po Cheng
- Applicant: Sung-Po Cheng
- Assignee: Avision Inc.
- Current Assignee: Avision Inc.
- Priority: TW094131251 20050912
- Main IPC: H04N1/46
- IPC: H04N1/46

Abstract:
A calibration mechanism of a scanning device including an assembly of a flexible member and a calibration strip and a limiting member is disclosed. The assembly of the flexible member and the calibration strip can travels in reciprocating motion, and the limiting element limits the distance of the vertical drift of the calibration strip. Thus, the calibration strip is confined within an anticipated position, the accuracy and the consistency of the calibration results for an optical module of the scanner, which acquires image data of a plurality of the scanning lines of the calibration strip, are greatly improved.
Public/Granted literature
- US07466458B2 Calibration mechanism of a scanning device Public/Granted day:2008-12-16
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