发明申请
US20070075315A1 System and method for compensating for thermal expansion of lithography apparatus or substrate 有权
用于补偿光刻设备或基板的热膨胀的系统和方法

System and method for compensating for thermal expansion of lithography apparatus or substrate
摘要:
To prevent a substrate from expanding significantly to generate overlay errors an exposure operation takes place in two parts. A first part exposes boundary areas and a second part exposes the larger, bulk areas. In one example, a portion of the substrate is fixed and the substrate is exposed progressively from parts furthest from the fixed portions towards the fixed portion. In another example, a plurality of high velocity scans take place instead of a single slow scan, and the substrate is allowed to cool between the high velocity scans. In another example, a lithographic apparatus is heated in order to maintain a temperature differential between the apparatus and the surrounding environment, and to minimize any fluctuation due to the exposing radiation.
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