Invention Application
- Patent Title: Method of detecting occurrence of error event in data and apparatus for the same
- Patent Title (中): 检测数据和装置中错误事件发生的方法
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Application No.: US11224351Application Date: 2005-09-13
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Publication No.: US20070079209A1Publication Date: 2007-04-05
- Inventor: Jihoon Park , Jaekyun Moon , Jun Lee
- Applicant: Jihoon Park , Jaekyun Moon , Jun Lee
- Applicant Address: KR Suwon-si US MN Minneapolis
- Assignee: SAMSUNG ELECTRONICS CO., LTD.,UNIVERSITY OF MINNESOTA
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.,UNIVERSITY OF MINNESOTA
- Current Assignee Address: KR Suwon-si US MN Minneapolis
- Main IPC: H03M13/00
- IPC: H03M13/00

Abstract:
A method of detecting an occurrence of an error event in data and an apparatus for the same are provided. The method includes: preparing an error detection code wherein syndrome sequences for dominant error events are all different; generating a codeword from source data using the error detection code; detecting the occurrence of the dominant error event in the codeword by checking a syndrome computed from the codeword; and determining a type and likely error starting positions of the occurred dominant error event using the syndrome sequences correspond to the syndrome.
Public/Granted literature
- US07620879B2 Method of detecting occurrence of error event in data and apparatus for the same Public/Granted day:2009-11-17
Information query
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