Invention Application
- Patent Title: TAPE MEASURE AND METHOD OF MANUFACTURE
- Patent Title (中): 胶带测量和制造方法
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Application No.: US11163199Application Date: 2005-10-10
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Publication No.: US20070079520A1Publication Date: 2007-04-12
- Inventor: Steven Levine , James Weir , Hamilton Whitney
- Applicant: Steven Levine , James Weir , Hamilton Whitney
- Main IPC: G01B3/10
- IPC: G01B3/10

Abstract:
A tape measure blade having improved wear characteristics, a tape measure utilizing such a blade, and a method of manufacturing such a blade are provided. A clear film made of polyester, nylon or other flexible, strong and relatively thin material is provided with the measurement indicia, markings or other material printed on one side thereof. The film is attached to the blade with the printed side contacting and secured to the blade such that the side of the film without printing is the side of the film exposed to the environment. Because the film is transparent the printed indicia are visible through the film.
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