发明申请
- 专利标题： Semiconductor memory device
- 专利标题（中）： 半导体存储器件
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申请号： US11246223申请日： 2005-10-11
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公开(公告)号： US20070081403A1公开(公告)日： 2007-04-12
- 发明人: Yasuhiro Nanba
- 申请人： Yasuhiro Nanba
- 主分类号： G11C29/00
- IPC分类号： G11C29/00
摘要：
A second roll call test mode is added in addition to a first roll call test mode for checking use/nonuse of a redundancy circuit. A semiconductor memory device is capable of confirming program states of an enable fuse and each address fuse by providing with a logic circuit which blocks program information of the enable fuse by using a second test mode signal.