Invention Application
- Patent Title: Integrated circuit test simulator
- Patent Title (中): 集成电路测试模拟器
-
Application No.: US11546509Application Date: 2006-10-11
-
Publication No.: US20070083351A1Publication Date: 2007-04-12
- Inventor: Gilles Van Assche , Jean-Louis Modave
- Applicant: Gilles Van Assche , Jean-Louis Modave
- Applicant Address: BE Zaventem
- Assignee: Proton World International N.V.
- Current Assignee: Proton World International N.V.
- Current Assignee Address: BE Zaventem
- Priority: FR05/53105 20051012
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
A method and a simulator for testing an electronic circuit by parallel execution of a program in the circuit and in a simulator, including a step of checking that commands and conditions contained in the simulator have effectively been executed during the test.
Information query
