• 专利标题: Crossbar-array designs and wire addressing methods that tolerate misalignment of electrical components at wire overlap points
  • 申请号: US11264464
    申请日: 2005-11-01
  • 公开(公告)号: US20070101309A1
    公开(公告)日: 2007-05-03
  • 发明人: Wei WuPhilip KuekesR. Williams
  • 申请人: Wei WuPhilip KuekesR. Williams
  • 主分类号: G06F17/50
  • IPC分类号: G06F17/50
Crossbar-array designs and wire addressing methods that tolerate misalignment of electrical components at wire overlap points
摘要:
Various embodiments of the present invention are directed to crossbar array designs that interfaces wires to address wires, despite misalignments between electrical components and wires. In one embodiment, a nanoscale device may be composed of a first layer of two or more wires and a second layer of two or more address wires that overlays the first layer. The nanoscale device may also include an intermediate layer positioned between the first layer and the second layer. Two or more redundant electrical component patterns may be fabricated within the intermediate layer so that one or more of the electrical component patterns is aligned with the first and second layers.
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