- 专利标题: Diagnostic circuit and method therefor
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申请号: US11272359申请日: 2005-11-14
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公开(公告)号: US20070108991A1公开(公告)日: 2007-05-17
- 发明人: Alan Ball
- 申请人: Alan Ball
- 专利权人: Semiconductor Components Industries, LLC.
- 当前专利权人: Semiconductor Components Industries, LLC.
- 主分类号: G01R31/02
- IPC分类号: G01R31/02
摘要:
In one embodiment, a diagnostic circuit is used to test the on-resistance of a transistor.
公开/授权文献
- US07256605B2 Diagnostic circuit and method therefor 公开/授权日:2007-08-14