发明申请
- 专利标题： Apparatus And Method For Adjusting An Orientation Of Probes
- 专利标题（中）： 用于调整探针取向的装置和方法
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申请号： US11164737申请日： 2005-12-02
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公开(公告)号： US20070126435A1公开(公告)日： 2007-06-07
- 发明人: Benjamin Eldridge , Eric Hobbs , Gaetan Mathieu , Makarand Shinde , Alexander Slocum
- 申请人： Benjamin Eldridge , Eric Hobbs , Gaetan Mathieu , Makarand Shinde , Alexander Slocum
- 申请人地址： US Livermore
- 专利权人： FormFactor, Inc.
- 当前专利权人： FormFactor, Inc.
- 当前专利权人地址： US Livermore
- 主分类号： G01R31/02
- IPC分类号： G01R31/02
摘要：
Probes of a probe card assembly can be adjusted with respect to an element of the probe card assembly, which can be an element of the probe card assembly that facilitates mounting of the probe card assembly to a test apparatus. The probe card assembly can then be mounted in a test apparatus, and an orientation of the probe card assembly can be adjusted with respect to the test apparatus, such as a structural part of the test apparatus or a structural element attached to the test apparatus.
公开/授权文献
- US07671614B2 Apparatus and method for adjusting an orientation of probes 公开/授权日：2010-03-02
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