Invention Application
- Patent Title: Apparatus And Method For Adjusting An Orientation Of Probes
- Patent Title (中): 用于调整探针取向的装置和方法
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Application No.: US11164737Application Date: 2005-12-02
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Publication No.: US20070126435A1Publication Date: 2007-06-07
- Inventor: Benjamin Eldridge , Eric Hobbs , Gaetan Mathieu , Makarand Shinde , Alexander Slocum
- Applicant: Benjamin Eldridge , Eric Hobbs , Gaetan Mathieu , Makarand Shinde , Alexander Slocum
- Applicant Address: US Livermore
- Assignee: FormFactor, Inc.
- Current Assignee: FormFactor, Inc.
- Current Assignee Address: US Livermore
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
Probes of a probe card assembly can be adjusted with respect to an element of the probe card assembly, which can be an element of the probe card assembly that facilitates mounting of the probe card assembly to a test apparatus. The probe card assembly can then be mounted in a test apparatus, and an orientation of the probe card assembly can be adjusted with respect to the test apparatus, such as a structural part of the test apparatus or a structural element attached to the test apparatus.
Public/Granted literature
- US07671614B2 Apparatus and method for adjusting an orientation of probes Public/Granted day:2010-03-02
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