发明申请
- 专利标题: EQUIPMENT INSPECTION SUPPORT SYSTEM, EQUIPMENT INSPECTION SUPPORT METHOD, AND PROGRAM THEREFOR
- 专利标题(中): 设备检查支持系统,设备检查支持方法及其程序
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申请号: US11674360申请日: 2007-02-13
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公开(公告)号: US20070129914A1公开(公告)日: 2007-06-07
- 发明人: Ai Yano , Tatsuro Matsumoto , Kazuo Sasaki , Satoru Watanabe , Masayuki Fukui , Eiichi Takahashi
- 申请人: Ai Yano , Tatsuro Matsumoto , Kazuo Sasaki , Satoru Watanabe , Masayuki Fukui , Eiichi Takahashi
- 申请人地址: JP Kawasaki
- 专利权人: FUJITSU LIMITED
- 当前专利权人: FUJITSU LIMITED
- 当前专利权人地址: JP Kawasaki
- 优先权: JP2005-314340 20051028; JP2006-288219 20061024
- 主分类号: G21C17/00
- IPC分类号: G21C17/00
摘要:
An equipment inspection support system, equipment inspection support method, and program therefor are disclosed. The system includes a maintenance and inspection management unit for selecting and transmitting to a terminal device inspection item contents stored in a contents storage unit, and receiving the inspection result data transmitted from the terminal device; a timing determination unit for determining status information acquisition timing by the status information acquisition device based on the inspection item contents to be transmitted to the terminal device by the maintenance and inspection management unit and the inspection result data transmitted from the terminal device; a status information acquisition unit for collecting status information acquired by the status information acquisition device according to the status information acquisition timing determined by the timing determination unit; a result data control unit for creating a result data correspondence table for associating the inspection result data received by the maintenance and inspection management unit and the status information collected by the status information acquisition unit; and an inspection result storage unit for storing the inspection result data, status information and result data correspondence table.
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