发明申请
US20070140560A1 Layout analysis program, layout analysis apparatus and layout analysis method
有权
布局分析程序,布局分析仪器和布局分析方法
- 专利标题: Layout analysis program, layout analysis apparatus and layout analysis method
- 专利标题(中): 布局分析程序,布局分析仪器和布局分析方法
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申请号: US11384327申请日: 2006-03-21
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公开(公告)号: US20070140560A1公开(公告)日: 2007-06-21
- 发明人: Yutaka Katsuyama , Hiroaki Takebe , Koji Kurokawa , Katsuhito Fujimoto
- 申请人: Yutaka Katsuyama , Hiroaki Takebe , Koji Kurokawa , Katsuhito Fujimoto
- 申请人地址: JP Kawasaki
- 专利权人: Fujitsu Limited
- 当前专利权人: Fujitsu Limited
- 当前专利权人地址: JP Kawasaki
- 优先权: JP2005-366466 20051220
- 主分类号: G06K9/34
- IPC分类号: G06K9/34
摘要:
A layout analysis program, a layout analysis apparatus, layout analysis method and a medium can highly accurately extract a text block from an image if the image is a color image. The layout analysis program causes a computer to execute a divided region extracting step that extracts a region partitioned by a pattern according to a binary image so as to use the outcome of extraction as divided region, a set of character elements extracting step that extracts a set of the character elements extracted by a first binary image layout analysis process for each extracted divided region so as to use the outcome of extraction as set of character elements, a text block extracting step that extracts a region including the extracted set of character elements in each divided region so as to avoid overlapping the non-character elements extracted by a second binary image layout analysis process and use the outcome of extraction as text block and a layout information generating step that generates layout information according to the text block and the non-character elements extracted by the second binary image layout analysis process.
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