发明申请
US20070144626A1 In-furnace temperature measuring method 失效
炉内温度测量方法

  • 专利标题: In-furnace temperature measuring method
  • 专利标题(中): 炉内温度测量方法
  • 申请号: US11387868
    申请日: 2006-03-24
  • 公开(公告)号: US20070144626A1
    公开(公告)日: 2007-06-28
  • 发明人: Takashi Fukuda
  • 申请人: Takashi Fukuda
  • 申请人地址: JP Kawasaki
  • 专利权人: Fujitsu Limited
  • 当前专利权人: Fujitsu Limited
  • 当前专利权人地址: JP Kawasaki
  • 优先权: JPJP2005-372309 20051226
  • 主分类号: C21D11/00
  • IPC分类号: C21D11/00
In-furnace temperature measuring method
摘要:
There is provided an in-furnace temperature measuring method that is capable of reducing the number of operation steps that are required for temperature measurement, and effectively applying a measurement result even if colors and finishing states of a circuit board and an electronic part are changed. First and second pseudo circuit boards (12) and (13) having the substantially same configuration and dimensions as those of a circuit board are inserted into a reflow furnace (11), the front and rear surface temperatures of the first and second pseudo circuit boards (12) and (13) and air temperatures around the first and second pseudo circuit boards (12) and (13) within the reflow furnace (11) are measured. The entire surface of a metal whose physical value is known is black-coated in the first pseudo circuit board (12), and the entire surface of a metal whose given physical value is known is mirror-finished in the second pseudo circuit board (13).
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