An integrated circuit temperature sensor includes a sensing circuit operable to determine whether the integrated circuit is currently exposed to one of a relatively low temperature or a relatively high temperature. A selection circuit operates to select a measured voltage across the base-emitter of a bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively low temperature or, alternatively, select a measured delta voltage across the base-emitter of the bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively high temperature. A comparator then compares the selected measured voltage across the base-emitter of the bipolar transistor against a first reference voltage indicative of a too cold temperature condition or compares the selected measured delta voltage across the base-emitter of the bipolar transistor against a second reference voltage indicative of a too hot temperature condition. As a result of the comparison, detection may be made as to whether the integrated circuit is currently exposed to one of either a too cold or too hot temperature.