Invention Application
- Patent Title: Miniaturized system and method for measuring optical characteristics
- Patent Title (中): 小型化系统及测量光学特性的方法
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Application No.: US11541957Application Date: 2006-10-02
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Publication No.: US20070146711A1Publication Date: 2007-06-28
- Inventor: Wayne Jung , Russell Jung , Walter Sloan , Alan Loudermilk
- Applicant: Wayne Jung , Russell Jung , Walter Sloan , Alan Loudermilk
- Main IPC: G01J3/51
- IPC: G01J3/51

Abstract:
A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second set of the plurality of light receivers. A processor, wherein the processor receives data generated by the first spectrometer system and the second spectrometer system, wherein an optical measurement of a sample under test is produced based on the data generated by the first and second spectrometer systems.
Public/Granted literature
- US07477364B2 Miniaturized system and method for measuring optical characteristics Public/Granted day:2009-01-13
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