发明申请
- 专利标题： Apparatus and methods for testing the life of a leakage current protection device
- 专利标题（中）： 用于测试漏电流保护装置寿命的装置和方法
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申请号： US11588016申请日： 2006-10-26
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公开(公告)号： US20070146944A1公开(公告)日： 2007-06-28
- 发明人: Feng Zhang , Hongliang Chen , Fu Wang , Wusheng Chen , Yulin Zhang , Huaiyin Song
- 申请人： Feng Zhang , Hongliang Chen , Fu Wang , Wusheng Chen , Yulin Zhang , Huaiyin Song
- 申请人地址： CN Yueqing
- 专利权人： General Protecht Group, Inc.
- 当前专利权人： General Protecht Group, Inc.
- 当前专利权人地址： CN Yueqing
- 优先权： CN200510132844.2 20051227
- 主分类号： H02H3/00
- IPC分类号： H02H3/00
摘要：
An apparatus for testing the life of a leakage current protection device, comprising a microcontroller unit, at least one of a first fault detector and a second fault detector, at least one of an audio alarm and a visual alarm, a power supply circuit. In operation, the first fault detector and/or the second fault detector receive at least one signal from the leakage current protection device, and generate at least one DC voltage corresponding to the at least one signal to be received by the MCU. The MCU compares the at least one DC voltage with a predetermined threshold value to determine whether a fault exists in the leakage current protection device, and activates the alarm circuit if at least one fault exists.