Invention Application
US20070147583A1 X-Ray Micro-Tomography System Optimized for High Resolution, Throughput, Image Quality
有权
X射线微层析成像系统针对高分辨率，吞吐量，图像质量进行了优化
- Patent Title: X-Ray Micro-Tomography System Optimized for High Resolution, Throughput, Image Quality
- Patent Title (中): X射线微层析成像系统针对高分辨率，吞吐量，图像质量进行了优化
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Application No.: US11682503Application Date: 2007-03-06
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Publication No.: US20070147583A1Publication Date: 2007-06-28
- Inventor: Yuxin Wang , Wenbing Yun , David Scott
- Applicant: Yuxin Wang , Wenbing Yun , David Scott
- Applicant Address: US CA Concord 94520
- Assignee: XRADIA, INC.
- Current Assignee: XRADIA, INC.
- Current Assignee Address: US CA Concord 94520
- Main IPC: A61B6/00
- IPC: A61B6/00 ; G01N23/00 ; G21K1/12 ; H05G1/60
Abstract:
A projection x-ray imaging system that possibly utilizes a laboratory-based micro-focused x-ray source is disclosed. Techniques for optimizing the system for high quality, three dimensional image formation with tomographic imaging with the potential for high resolution and high throughput are described. It also concerns ways to optimize the system design to obtain improved image quality.
Public/Granted literature
- US07388942B2 X-ray micro-tomography system optimized for high resolution, throughput, image quality Public/Granted day:2008-06-17
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