发明申请
- 专利标题: Digital calibration loop for an analog to digital converter
- 专利标题(中): 用于模数转换器的数字校准回路
-
申请号: US11637801申请日: 2006-12-13
-
公开(公告)号: US20070152863A1公开(公告)日: 2007-07-05
- 发明人: Michael Le , Chun-Ying Chen , Wynstan Tong , Kwang Kim , Hui Pan
- 申请人: Michael Le , Chun-Ying Chen , Wynstan Tong , Kwang Kim , Hui Pan
- 申请人地址: US CA Irvine
- 专利权人: Broadcom Corporation
- 当前专利权人: Broadcom Corporation
- 当前专利权人地址: US CA Irvine
- 主分类号: H03M1/12
- IPC分类号: H03M1/12
摘要:
A method and apparatus to counter effects of an offset voltage by calibrating an analog-to-digital converter (ADC). A digital calibration loop minimizes the effects of offset voltage to improve ADC accuracy as well as provide a low-power, submicron-scale ADC. A calibration circuit senses an ADC output and adjusts a variable calibration voltage to counter the effects of the offset voltage. Reduction of the offset voltage effects increases the ADC accuracy.
公开/授权文献
- US07623050B2 Digital calibration loop for an analog to digital converter 公开/授权日:2009-11-24
信息查询