发明申请
US20070153598A1 Measuring method for a semiconductor memory, and semiconductor memory
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半导体存储器和半导体存储器的测量方法
- 专利标题： Measuring method for a semiconductor memory, and semiconductor memory
- 专利标题（中）： 半导体存储器和半导体存储器的测量方法
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申请号： US11638766申请日： 2006-12-14
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公开(公告)号： US20070153598A1公开(公告)日： 2007-07-05
- 发明人: Ulrich Zimmermann
- 申请人： Ulrich Zimmermann
- 优先权： DE102005060086.7 20051215
- 主分类号： G11C29/00
- IPC分类号： G11C29/00
摘要：
The invention relates to a semiconductor memory, and to a measuring method for a semiconductor memory. In one case, the method includes connecting a memory cell to a ring oscillator and measuring the frequency resulting for said ring oscillator.
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