发明申请
US20070167028A1 FILM FORMATION METHOD AND APPARATUS FOR SEMICONDUCTOR PROCESS 失效
薄膜形成方法和半导体工艺设备

  • 专利标题: FILM FORMATION METHOD AND APPARATUS FOR SEMICONDUCTOR PROCESS
  • 专利标题(中): 薄膜形成方法和半导体工艺设备
  • 申请号: US11623483
    申请日: 2007-01-16
  • 公开(公告)号: US20070167028A1
    公开(公告)日: 2007-07-19
  • 发明人: Pao-Hwa CHOUKazuhide Hasebe
  • 申请人: Pao-Hwa CHOUKazuhide Hasebe
  • 优先权: JP2006-007951 20060116
  • 主分类号: H01L21/31
  • IPC分类号: H01L21/31
FILM FORMATION METHOD AND APPARATUS FOR SEMICONDUCTOR PROCESS
摘要:
An insulating film is formed on a target substrate by CVD, in a process field to be selectively supplied with a first process gas containing a silane family gas, a second process gas containing a nitriding gas, and a third process gas containing a carbon hydride gas. This method includes repeatedly performing supply of the first process gas to the process field, supply of the second process gas to the process field, and supply of the third process gas to the process field. The supply of the third process gas includes an excitation period of supplying the third process gas to the process field while exciting the third process gas by an exciting mechanism.
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