Invention Application
US20070174023A1 Methods and apparatus for considering a project environment during defect analysis
审中-公开
在缺陷分析过程中考虑项目环境的方法和设备
- Patent Title: Methods and apparatus for considering a project environment during defect analysis
- Patent Title (中): 在缺陷分析过程中考虑项目环境的方法和设备
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Application No.: US11340740Application Date: 2006-01-26
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Publication No.: US20070174023A1Publication Date: 2007-07-26
- Inventor: Kathryn Bassin , Paul Beyer , Linda Clough , Sandra Hardman , Deborah Masters , Susan Skrabanek , Nathan Steffenhagen
- Applicant: Kathryn Bassin , Paul Beyer , Linda Clough , Sandra Hardman , Deborah Masters , Susan Skrabanek , Nathan Steffenhagen
- Applicant Address: US NY ARMONK
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY ARMONK
- Main IPC: G06F11/30
- IPC: G06F11/30
Abstract:
In a first aspect, a first defect analysis method is provided. The first method includes the steps of (1) while testing a software project, identifying at least one failure caused by an environment of the project; and (2) considering the effect of the project environment on the software project while analyzing the failure. Numerous other aspects are provided.
Information query
