发明申请
- 专利标题: Coater/developer and coating/developing method
- 专利标题(中): 涂料/显影剂和涂料/显影方法
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申请号: US10590314申请日: 2004-12-16
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公开(公告)号: US20070177869A1公开(公告)日: 2007-08-02
- 发明人: Taro Yamamoto , Hideharu Kyouda
- 申请人: Taro Yamamoto , Hideharu Kyouda
- 申请人地址: JP Minato-ku, Tokyo 107-8481
- 专利权人: Tokyo Electon Limited
- 当前专利权人: Tokyo Electon Limited
- 当前专利权人地址: JP Minato-ku, Tokyo 107-8481
- 优先权: JP2004-107195 20040331
- 国际申请: PCT/JP04/18831 WO 20041216
- 主分类号: G03D5/00
- IPC分类号: G03D5/00
摘要:
Accurate coating and developing having high intrasurface uniformity is achieved by suppressing the influence of components of a resist that may be eluted while a substrate coated with the resist is processed by immersion exposure. A coating unit coats a surface of a substrate with a resist. then, a first cleaning means including a cleaning nozzle cleans the substrate and then the substrate is subjected to an exposure process. Since only a small amount of components of the resist dissolves in a transparent liquid layer formed on the substrate for exposure, an exposure process can form lines in accurate line-widths. Consequently, a resist pattern of lines having accurate line-widths having high intrasurface uniformity can be formed on the substrate by developing the exposed resist.
公开/授权文献
- US07665916B2 Coater/developer and coating/developing method 公开/授权日:2010-02-23
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