发明申请
US20070177869A1 Coater/developer and coating/developing method 失效
涂料/显影剂和涂料/显影方法

  • 专利标题: Coater/developer and coating/developing method
  • 专利标题(中): 涂料/显影剂和涂料/显影方法
  • 申请号: US10590314
    申请日: 2004-12-16
  • 公开(公告)号: US20070177869A1
    公开(公告)日: 2007-08-02
  • 发明人: Taro YamamotoHideharu Kyouda
  • 申请人: Taro YamamotoHideharu Kyouda
  • 申请人地址: JP Minato-ku, Tokyo 107-8481
  • 专利权人: Tokyo Electon Limited
  • 当前专利权人: Tokyo Electon Limited
  • 当前专利权人地址: JP Minato-ku, Tokyo 107-8481
  • 优先权: JP2004-107195 20040331
  • 国际申请: PCT/JP04/18831 WO 20041216
  • 主分类号: G03D5/00
  • IPC分类号: G03D5/00
Coater/developer and coating/developing method
摘要:
Accurate coating and developing having high intrasurface uniformity is achieved by suppressing the influence of components of a resist that may be eluted while a substrate coated with the resist is processed by immersion exposure. A coating unit coats a surface of a substrate with a resist. then, a first cleaning means including a cleaning nozzle cleans the substrate and then the substrate is subjected to an exposure process. Since only a small amount of components of the resist dissolves in a transparent liquid layer formed on the substrate for exposure, an exposure process can form lines in accurate line-widths. Consequently, a resist pattern of lines having accurate line-widths having high intrasurface uniformity can be formed on the substrate by developing the exposed resist.
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