发明申请
US20070180897A1 Method for recording microstructural changes in a component 失效
用于记录组件中的微结构变化的方法

Method for recording microstructural changes in a component
摘要:
The microstructure of components, particularly layer systems, deteriorates under excessive thermal and/or mechanical stress. Previous test methods are destructive, parts being cut out of the layer system and being microstructurally analyzed. The inventive method allows a deterioration to be determined by means of special, simple non-destructive measurements that are repeated at specific intervals using a mechanical indenter test, for example.
公开/授权文献
信息查询
0/0