发明申请
- 专利标题: Method for recording microstructural changes in a component
- 专利标题(中): 用于记录组件中的微结构变化的方法
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申请号: US10589791申请日: 2005-02-14
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公开(公告)号: US20070180897A1公开(公告)日: 2007-08-09
- 发明人: Michael Dankert , Martin Feldhege , Stefan Irmisch , Matthias Oechsner , Eckart Schumann , Werner Stamm
- 申请人: Michael Dankert , Martin Feldhege , Stefan Irmisch , Matthias Oechsner , Eckart Schumann , Werner Stamm
- 优先权: EP04003538.8 20040217
- 国际申请: PCT/EP05/01469 WO 20050214
- 主分类号: F01L1/46
- IPC分类号: F01L1/46
摘要:
The microstructure of components, particularly layer systems, deteriorates under excessive thermal and/or mechanical stress. Previous test methods are destructive, parts being cut out of the layer system and being microstructurally analyzed. The inventive method allows a deterioration to be determined by means of special, simple non-destructive measurements that are repeated at specific intervals using a mechanical indenter test, for example.
公开/授权文献
- US07584669B2 Method for recording microstructural changes in a component 公开/授权日:2009-09-08