Invention Application
- Patent Title: Method for recording microstructural changes in a component
- Patent Title (中): 用于记录组件中的微结构变化的方法
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Application No.: US10589791Application Date: 2005-02-14
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Publication No.: US20070180897A1Publication Date: 2007-08-09
- Inventor: Michael Dankert , Martin Feldhege , Stefan Irmisch , Matthias Oechsner , Eckart Schumann , Werner Stamm
- Applicant: Michael Dankert , Martin Feldhege , Stefan Irmisch , Matthias Oechsner , Eckart Schumann , Werner Stamm
- Priority: EP04003538.8 20040217
- International Application: PCT/EP05/01469 WO 20050214
- Main IPC: F01L1/46
- IPC: F01L1/46

Abstract:
The microstructure of components, particularly layer systems, deteriorates under excessive thermal and/or mechanical stress. Previous test methods are destructive, parts being cut out of the layer system and being microstructurally analyzed. The inventive method allows a deterioration to be determined by means of special, simple non-destructive measurements that are repeated at specific intervals using a mechanical indenter test, for example.
Public/Granted literature
- US07584669B2 Method for recording microstructural changes in a component Public/Granted day:2009-09-08
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