- 专利标题: Mass spectrometer and mass spectrometry
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申请号: US11699366申请日: 2007-01-30
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公开(公告)号: US20070181801A1公开(公告)日: 2007-08-09
- 发明人: Masuyoshi Yamada , Masao Suga , Izumi Waki
- 申请人: Masuyoshi Yamada , Masao Suga , Izumi Waki
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 优先权: JP2006-031585 20060208
- 主分类号: H01J49/00
- IPC分类号: H01J49/00
摘要:
A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at a pressure level lower than that of the first ion source respectively. Preferably, the flow rate of the sample gas introduced to the APCI ion source is made more than the flow rate of the sample gas introduced to the EI ion source, so that the pressure for each of the ion sources can be maintained and analysis can be conducted by each ionization at a good balance in view of the sensitivity.
公开/授权文献
- US07420180B2 Mass spectrometer and mass spectrometry 公开/授权日:2008-09-02
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