发明申请
US20070201029A1 EVALUATING METHOD AND APPARATUS THEREOF 有权
评估方法及其设备

  • 专利标题: EVALUATING METHOD AND APPARATUS THEREOF
  • 专利标题(中): 评估方法及其设备
  • 申请号: US11742065
    申请日: 2007-04-30
  • 公开(公告)号: US20070201029A1
    公开(公告)日: 2007-08-30
  • 发明人: Takayuki JINNO
  • 申请人: Takayuki JINNO
  • 申请人地址: JP Tokyo
  • 专利权人: CANON KABUSHIKI KAISHA
  • 当前专利权人: CANON KABUSHIKI KAISHA
  • 当前专利权人地址: JP Tokyo
  • 优先权: JP2005-082709 20050322
  • 主分类号: G01N21/47
  • IPC分类号: G01N21/47
EVALUATING METHOD AND APPARATUS THEREOF
摘要:
A measurement apparatus measures the spatial distributed characteristic of reflection of an object. Evaluate parameters used to evaluate the gloss character of the object are extracted based on the measurement result. An evaluate value indicating the gloss character of the object is calculated based on the extracted evaluate parameters. The calculated evaluate value is visually displayed on at least a two-dimensional space specified by the evaluate parameters.
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