Invention Application
- Patent Title: Method and apparatus for detecting offset in an orthogonal frequency division multiplexing system
- Patent Title (中): 用于在正交频分复用系统中检测偏移的方法和装置
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Application No.: US11706151Application Date: 2007-02-14
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Publication No.: US20070206692A1Publication Date: 2007-09-06
- Inventor: Yun-Ju Kwon , Su-Jin Yoon
- Applicant: Yun-Ju Kwon , Su-Jin Yoon
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR14370/2006 20060214
- Main IPC: H04K1/10
- IPC: H04K1/10

Abstract:
Disclosed is a method for detecting a frequency offset in an Orthogonal Frequency Division Multiplexing (OFDM) system. The method includes determining a first frequency index based on autocorrelation values calculated according to a frequency index for a pilot signal of a received symbol, accumulating the autocorrelation values calculated according to the frequency index for the pilot signal of the received symbol depending on a symbol count, and determining a second frequency index based on the accumulated autocorrelation values, and determining at least one of the first frequency index and the second frequency as a frequency offset according to channel quality.
Public/Granted literature
- US07945003B2 Method and apparatus for detecting offset in an orthogonal frequency division multiplexing system Public/Granted day:2011-05-17
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