发明申请
- 专利标题: X-Ray Unit
- 专利标题(中): X光单元
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申请号: US10573743申请日: 2004-09-24
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公开(公告)号: US20070206725A1公开(公告)日: 2007-09-06
- 发明人: Gereon Vogtmeier , Francisco Morales Serrano
- 申请人: Gereon Vogtmeier , Francisco Morales Serrano
- 申请人地址: NL Eindhoven
- 专利权人: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人地址: NL Eindhoven
- 优先权: EP03103667.6 20031002
- 国际申请: PCT/IB04/51847 WO 20040924
- 主分类号: H05G1/30
- IPC分类号: H05G1/30
摘要:
An X-ray unit according to the invention has a first arrangement (2) that is intended for the contactless and X-ray free measurement of first data of an object (1). A control unit (3) controls, on the basis of the first data of the object, a second arrangement (4) that measures X-ray data of the object by means of X-rays. With such an X-ray unit, first data 5 of the object can be obtained without using X-rays and control of the measurement of the Xray data is made possible, with the result that, data, only a minimum X-ray dose is applied to the object.
公开/授权文献
- US07545912B2 X-ray unit 公开/授权日:2009-06-09
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