发明申请
- 专利标题: SCANNING ELECTRON MICROSCOPE AND A METHOD FOR IMAGING A SPECIMEN USING THE SAME
- 专利标题(中): 扫描电子显微镜和使用其形成样品的方法
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申请号: US11673219申请日: 2007-02-09
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公开(公告)号: US20070210252A1公开(公告)日: 2007-09-13
- 发明人: Atsushi MIYAMOTO , Wataru Nagatomo , Ryoichi Matsuoka , Hidetoshi Morokuma
- 申请人: Atsushi MIYAMOTO , Wataru Nagatomo , Ryoichi Matsuoka , Hidetoshi Morokuma
- 优先权: JP2006-040125 20060217
- 主分类号: G21K7/00
- IPC分类号: G21K7/00
摘要:
(1) part or all of the number, coordinates and size/shape and imaging sequence of imaging points each for observation, the imaging position change method and imaging conditions can be calculated automatically from CAD data, (2) a combination of input information and output information for imaging recipe creation can be set arbitrarily, and (3) decision is made of imaging or processing at an arbitrary imaging point as to whether to be successful/unsuccessful and in case a failure is determined, a relief process can be conducted in which the imaging point or imaging sequence is changed.
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