Invention Application
US20070211558A1 Circuit and method for detecting synchronous mode in a semiconductor memory apparatus
失效
用于在半导体存储装置中检测同步模式的电路和方法
- Patent Title: Circuit and method for detecting synchronous mode in a semiconductor memory apparatus
- Patent Title (中): 用于在半导体存储装置中检测同步模式的电路和方法
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Application No.: US11641044Application Date: 2006-12-19
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Publication No.: US20070211558A1Publication Date: 2007-09-13
- Inventor: Sang Kwon Lee
- Applicant: Sang Kwon Lee
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Priority: KR10-2006-0021221 20060307
- Main IPC: G11C8/00
- IPC: G11C8/00
Abstract:
A circuit for detecting synchronous mode in a semiconductor memory apparatus includes a control unit that controls the driving of a clock according to whether or not a valid address signal is enabled. A driving unit drives the clock according to the control of the control unit. A latch unit latches the clock driven by the driving unit and outputs a synchronous mode signal.
Public/Granted literature
- US07450464B2 Circuit and method for detecting synchronous mode in a semiconductor memory apparatus Public/Granted day:2008-11-11
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