发明申请
US20070215804A1 Quantum Beam Aided Atomic Force Microscopy and Quantum Beam Aided Atomic Force Microscope
失效
量子束辅助原子力显微镜和量子束辅助原子力显微镜
- 专利标题: Quantum Beam Aided Atomic Force Microscopy and Quantum Beam Aided Atomic Force Microscope
- 专利标题(中): 量子束辅助原子力显微镜和量子束辅助原子力显微镜
-
申请号: US11587031申请日: 2004-12-21
-
公开(公告)号: US20070215804A1公开(公告)日: 2007-09-20
- 发明人: Shushi Suzuki , Wang-Jae Chun , Kiyotaka Asakura , Masaharu Nomura
- 申请人: Shushi Suzuki , Wang-Jae Chun , Kiyotaka Asakura , Masaharu Nomura
- 专利权人: JAPAN SCIENCE AND TECHNOLOGY AGENCY
- 当前专利权人: JAPAN SCIENCE AND TECHNOLOGY AGENCY
- 优先权: JP2004-126099 20040421
- 国际申请: PCT/JP04/19092 WO 20041221
- 主分类号: G01N23/22
- IPC分类号: G01N23/22
摘要:
A quantum beam aided atomic force microscopy and quantum beam aided atomic force microscope that can simultaneously perform atomic-level configuration observation and elemental analysis with the use of an atomic force microscope and further can effect analysis of the chemical state of sample surface and that as being operable in liquids, can realize the elemental analysis and chemical state analysis of biosamples with an atomic-level resolving power. Accordingly, atoms of sample surface are irradiated with quantum beams, such as charged particles, electrons and photons, having a given electron transition energy characteristic of element, and any change in interaction force between the atoms of sample surface having been irradiated with quantum beams and the distal end of the probe is detected.