发明申请
US20070217087A1 Magnetic thin film and magnetoresistance effect element having a heusler alloy layer containing an additive element
审中-公开
磁性薄膜和磁阻效应元件具有包含添加元素的赫斯勒合金层
- 专利标题： Magnetic thin film and magnetoresistance effect element having a heusler alloy layer containing an additive element
- 专利标题（中）： 磁性薄膜和磁阻效应元件具有包含添加元素的赫斯勒合金层
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申请号： US11723143申请日： 2007-03-16
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公开(公告)号： US20070217087A1公开(公告)日： 2007-09-20
- 发明人: Kei Hirata , Keita Kawamori , Tomohito Mizuno , Yoshihiro Tsuchiya , Koji Shimazawa
- 申请人： Kei Hirata , Keita Kawamori , Tomohito Mizuno , Yoshihiro Tsuchiya , Koji Shimazawa
- 申请人地址： JP Tokyo
- 专利权人： TDK Corporation
- 当前专利权人： TDK Corporation
- 当前专利权人地址： JP Tokyo
- 优先权： JP2006-074521 20060317
- 主分类号： G11B5/127
- IPC分类号： G11B5/127 ; G11B5/33
摘要：
A magnetic thin film has a layer which is formed of an alloy having a ordered crystal structure whose composition formula is represented by XYZ or X2YZ (where X is one or more than one of the elements selected from the group consisting of Co, Ir, Rh, Pt, and Cu, Y is one or more than one of the elements selected from the group consisting of V, Cr, Mn, and Fe, and Z is one or more than one of the elements selected the group consisting of Al, Si, Ge, As, Sb, Bi, In, Ti, and Pb). The alloy contains at least one additive element which is not included in the composition formula of the alloy and which has a Debye temperature that is equal to or less than 300K.
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