发明申请
- 专利标题： Functional blocks for assembly and method of manufacture
- 专利标题（中）： 组装功能块和制造方法
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申请号： US11254096申请日： 2005-10-19
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公开(公告)号： US20070231949A1公开(公告)日： 2007-10-04
- 发明人: William Huber , Ching-Yeu Wei
- 申请人： William Huber , Ching-Yeu Wei
- 专利权人： General Electric Company
- 当前专利权人： General Electric Company
- 主分类号： H01L21/00
- IPC分类号： H01L21/00 ; H01L21/30 ; H01L21/46 ; H01L23/48 ; H01L23/52 ; H01L29/40
摘要：
A functional block for assembly includes at least one element and a patterned magnetic film comprising at least one magnetic region attached to the element. A wafer includes a host substrate comprising a number of elements. The wafer further includes a patterned magnetic film attached to the elements and comprising a number of magnetic regions. The magnetic regions are attached to respective ones of the elements. A method of manufacture includes forming a number of magnetic regions on a host substrate having an array of elements. The forming step provides at least one of the magnetic regions for a respective group comprising at least one of the elements.
公开/授权文献
- US08022416B2 Functional blocks for assembly 公开/授权日：2011-09-20
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