Invention Application
- Patent Title: PROBE CARD AND METHOD FOR PRODUCING THE SAME
- Patent Title (中): 探针卡及其制造方法
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Application No.: US11766656Application Date: 2007-06-21
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Publication No.: US20070240305A1Publication Date: 2007-10-18
- Inventor: Dai-Gil LEE , Seong-Su Kim , Byung-Chul Kim , Dong-Chang Park
- Applicant: Dai-Gil LEE , Seong-Su Kim , Byung-Chul Kim , Dong-Chang Park
- Applicant Address: KR Daejeon
- Assignee: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
- Current Assignee: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
- Current Assignee Address: KR Daejeon
- Priority: KR10-2005-0031100 20050414
- Main IPC: H05K3/00
- IPC: H05K3/00

Abstract:
A probe card is used in conducting a visual test for a target test object through simultaneous contact of the probe card with each and every electrode pad of the target test object. The probe card includes a plurality of probes composed of conductive wire strands and having elastically deformable contact parts so curved as to make contact with electrode pads of a target test object. The contact parts are oriented in one and the same direction and extend in a parallel relationship with one another. The probe card further includes a first insulating block for fixedly securing one end parts of the probes, a second insulating block for fixedly securing the other end parts of the probes and a mounting plate for holding the first and second insulating blocks in such a manner that the contact parts of the probes protrude outwardly.
Public/Granted literature
- US07319317B2 Probe card and method for producing the same Public/Granted day:2008-01-15
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