发明申请
- 专利标题: TUNNEL MAGNETIC RESISTANCE DEVICE, AND MAGNETIC MEMORY CELL AND MAGNETIC RANDOM ACCESS MEMORY USING THE SAME
- 专利标题(中): 隧道磁阻装置和磁记忆体和磁性随机存取存储器
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申请号: US11739956申请日: 2007-04-25
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公开(公告)号: US20070253118A1公开(公告)日: 2007-11-01
- 发明人: Jun Hayakawa , Hideo Ohno , Shoji Ikeda , Young Lee
- 申请人: Jun Hayakawa , Hideo Ohno , Shoji Ikeda , Young Lee
- 优先权: JP2006-122146 20060426
- 主分类号: G11B5/33
- IPC分类号: G11B5/33 ; G11B5/127
摘要:
Provided is a high-speed, super-low-power-consumption nonvolatile memory with a high thermal stability. A nonvolatile magnetic memory is equipped with high-output tunnel magnetic resistance devices to each of which a free layer with a high thermal stability is applied, while a writing method by spin transfer torque is applied to the memory. The tunnel magnetic resistance device has a free layer including a first ferromagnetic film and the second ferromagnetic film each of which has a body center cubic structure and each of which contains Co, Fe and B. The free layer, additionally, includes a first non-magnetic layer. The tunnel magnetic resistance device has a layered structure formed of the free layer and a pinned layer with a MgO insulating film with a (100) orientation rock-salt structure interposed in between.
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