发明申请
US20070253118A1 TUNNEL MAGNETIC RESISTANCE DEVICE, AND MAGNETIC MEMORY CELL AND MAGNETIC RANDOM ACCESS MEMORY USING THE SAME 有权
隧道磁阻装置和磁记忆体和磁性随机存取存储器

  • 专利标题: TUNNEL MAGNETIC RESISTANCE DEVICE, AND MAGNETIC MEMORY CELL AND MAGNETIC RANDOM ACCESS MEMORY USING THE SAME
  • 专利标题(中): 隧道磁阻装置和磁记忆体和磁性随机存取存储器
  • 申请号: US11739956
    申请日: 2007-04-25
  • 公开(公告)号: US20070253118A1
    公开(公告)日: 2007-11-01
  • 发明人: Jun HayakawaHideo OhnoShoji IkedaYoung Lee
  • 申请人: Jun HayakawaHideo OhnoShoji IkedaYoung Lee
  • 优先权: JP2006-122146 20060426
  • 主分类号: G11B5/33
  • IPC分类号: G11B5/33 G11B5/127
TUNNEL MAGNETIC RESISTANCE DEVICE, AND MAGNETIC MEMORY CELL AND MAGNETIC RANDOM ACCESS MEMORY USING THE SAME
摘要:
Provided is a high-speed, super-low-power-consumption nonvolatile memory with a high thermal stability. A nonvolatile magnetic memory is equipped with high-output tunnel magnetic resistance devices to each of which a free layer with a high thermal stability is applied, while a writing method by spin transfer torque is applied to the memory. The tunnel magnetic resistance device has a free layer including a first ferromagnetic film and the second ferromagnetic film each of which has a body center cubic structure and each of which contains Co, Fe and B. The free layer, additionally, includes a first non-magnetic layer. The tunnel magnetic resistance device has a layered structure formed of the free layer and a pinned layer with a MgO insulating film with a (100) orientation rock-salt structure interposed in between.
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