Invention Application
- Patent Title: Pattern recognition apparatus and method therefor
- Patent Title (中): 模式识别装置及其方法
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Application No.: US11712392Application Date: 2007-03-01
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Publication No.: US20070258644A1Publication Date: 2007-11-08
- Inventor: Tomokazu Kawahara , Osamu Yamaguchi , Kenichi Maeda
- Applicant: Tomokazu Kawahara , Osamu Yamaguchi , Kenichi Maeda
- Priority: JP2006-56995 20060502
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A pattern recognition apparatus includes an image inputting unit, a face-area extracting unit, a face-characteristic-point detecting unit, a normalized-image generating unit, a subspace generating unit, a similarity calculating unit, a reference-subspace storing unit, a judging unit, and a display unit. The pattern recognition apparatus calculates an input subspace from an input pattern, calculates a reference subspace from a reference pattern, and sets, with respect to orthogonal bases Φ1, . . . , ΦM of the input subspace and orthogonal bases Ψ1, . . . , ΨN of the reference subspace, an average of distances between Φi and Ψj (i=1, . . . , M and j=1, . . . , N) as a similarity, and performs identification using this similarity.
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