An object of the present invention is to provide a DC test apparatus capable of reducing wasteful standby power consumption. The DC test apparatus has a power amplifier circuit 130 for supplying a current to a DUT during a test. The power amplifier circuit 130 is provided with transistors 18 and 20 for generating an output current appropriate for an input voltage during current supply, resistors 54 and 56, and a variable resistance circuit 40 for setting a standby current flowing through these transistors 18 and 20 and the like during current supply to a smaller value at any time other than during current supply.