发明申请
- 专利标题: Semiconductor memory device
- 专利标题(中): 半导体存储器件
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申请号: US11797804申请日: 2007-05-08
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公开(公告)号: US20070263466A1公开(公告)日: 2007-11-15
- 发明人: Fukashi Morishita , Kazutami Arimoto
- 申请人: Fukashi Morishita , Kazutami Arimoto
- 专利权人: RENESAS TECHNOLOGY CORP.
- 当前专利权人: RENESAS TECHNOLOGY CORP.
- 优先权: JP2006-132895(P) 20060511
- 主分类号: G11C7/02
- IPC分类号: G11C7/02
摘要:
When data “1” is stored in a memory cell, a bit line is driven to an H level (control line drive potential) and the other bit line is driven to an L level (reference potential) when a sense operation is completed. When a verify write operation is initiated, a charge line is driven from an H level (power supply potential) to an L level (reference potential). By the GIDL current from a source line, accumulation of holes is initiated again for a storage node subsequent to discharge of holes, whereby the potential of the storage node rises towards an H level (period α). When the charge line is driven to an H level from an L level, the potential of the storage node further rises (period β).
公开/授权文献
- US07652927B2 Semiconductor memory device 公开/授权日:2010-01-26
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