Invention Application
- Patent Title: Probe for testing a device under test
- Patent Title (中): 探测用于测试被测设备
-
Application No.: US11888957Application Date: 2007-08-03
-
Publication No.: US20070273399A1Publication Date: 2007-11-29
- Inventor: K. Gleason , Tim Lesher , Mike Andrews , John Martin
- Applicant: K. Gleason , Tim Lesher , Mike Andrews , John Martin
- Assignee: Cascade Microtech, Inc.
- Current Assignee: Cascade Microtech, Inc.
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
Public/Granted literature
- US07394269B2 Probe for testing a device under test Public/Granted day:2008-07-01
Information query
