Invention Application
- Patent Title: Optical Measurement Apparatus
- Patent Title (中): 光学测量仪器
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Application No.: US10594528Application Date: 2005-03-29
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Publication No.: US20070273868A1Publication Date: 2007-11-29
- Inventor: Takakazu Yano , Kenji Matsumoto , Tadahiro Fukuda , Miharu Sugiura
- Applicant: Takakazu Yano , Kenji Matsumoto , Tadahiro Fukuda , Miharu Sugiura
- Priority: JP2004-094194 20040329; JP2004-276282 20040924; JP2004-278936 20040927
- International Application: PCT/JP05/06564 WO 20050329
- Main IPC: G01N1/00
- IPC: G01N1/00

Abstract:
An object of the present invention is to provide an optical measurement apparatus equipped with an ion-exchange resin for pretreating a sample, thereby enabling the concentration of component in the sample to be measured with higher accuracy. The optical measurement apparatus of the present invention includes, in addition to the ion-exchange resin, an optical measurement section for measuring, based on the optical characteristics of the component, the concentration of the component in the sample after the sample is passed through the ion-exchange resin.
Public/Granted literature
- US07583382B2 Optical measurement apparatus Public/Granted day:2009-09-01
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