发明申请
US20070279753A1 Patterning of mechanical layer in MEMS to reduce stresses at supports 失效
MEMS中机械层的图案化,以减少支撑件的应力

  • 专利标题: Patterning of mechanical layer in MEMS to reduce stresses at supports
  • 专利标题(中): MEMS中机械层的图案化,以减少支撑件的应力
  • 申请号: US11445529
    申请日: 2006-06-01
  • 公开(公告)号: US20070279753A1
    公开(公告)日: 2007-12-06
  • 发明人: Ming-Hau TungWonsuk Chung
  • 申请人: Ming-Hau TungWonsuk Chung
  • 主分类号: G02B27/14
  • IPC分类号: G02B27/14
Patterning of mechanical layer in MEMS to reduce stresses at supports
摘要:
A method of fabricating a MEMS device includes the formation of support posts having horizontal wing portions at the edges of the post. A mechanical layer is deposited over the support posts and portions of the mechanical layer overlying portions of the support post other than the horizontal wing portions are etched away. A resultant MEMS device includes a mechanical layer overlying at least a portion of the horizontal wing portions of the underlying support structures.
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