发明申请
- 专利标题: FILLING DEEP FEATURES WITH CONDUCTORS IN SEMICONDUCTOR MANUFACTURING
- 专利标题(中): 在半导体制造中填充导体的深度特征
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申请号: US11742302申请日: 2007-04-30
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公开(公告)号: US20070293040A1公开(公告)日: 2007-12-20
- 发明人: Ismail Emesh , Chantal Arena , Bulent Basol
- 申请人: Ismail Emesh , Chantal Arena , Bulent Basol
- 申请人地址: US AZ Phoenix
- 专利权人: ASM NUTOOL, INC.
- 当前专利权人: ASM NUTOOL, INC.
- 当前专利权人地址: US AZ Phoenix
- 主分类号: H01L21/4763
- IPC分类号: H01L21/4763
摘要:
A method of filling a conductive material in a three dimensional integration feature formed on a surface of a wafer is disclosed. The feature is optionally lined with dielectric and/or adhesion/barrier layers and then filled with a liquid mixture containing conductive precursor, such as a solution with dissolved ruthenium precursor or a dispersion or suspension with conductive particles (e.g., gold, silver, copper), and the substrate is rotated while the mixture is on its surface. Then, the liquid carrier is dried from the feature, leaving a conductive layer in the feature. These two steps are optionally repeated until the feature is filled up with the conductor. Then, the conductor is annealed in the feature, thereby forming a dense conductive plug in the feature.
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