发明申请
US20070297221A1 Memory cell programmed using a temperature controlled set pulse 失效
使用温度控制设置脉冲编程的存储单元

Memory cell programmed using a temperature controlled set pulse
摘要:
A memory device includes a phase change memory cell and a circuit. The circuit is for programming the memory cell to a selected one of more than two states by applying a temperature controlled set pulse to the memory cell.
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